CVE-2022-33214 (aqt1000_firmware, qam8295p_firmware, qca6390_firmware, qca6391_firmware, qca6420_firmware, qca6430_firmware, qca6574_firmware, qca6574a_firmware, qca6574au_firmware, qca6595au_firmware, qca6696_firmware, qcc5100_firmware, qcm2290_firmware, qcm4290_firmware, qcm6125_firmware, qcm6490_firmware, qcn7606_firmware, qcs2290_firmware, qcs410_firmware, qcs4290_firmware, qcs610_firmware, qcs6125_firmware, qcs6490_firmware, sa4150p_firmware, sa4155p_firmware, sa6145p_firmware, sa6150p_firmware, sa6155_firmware, sa6155p_firmware, sa8145p_firmware, sa8150p_firmware, sa8155_firmware, sa8155p_firmware, sa8195p_firmware, sa8295p_firmware, sd_675_firmware, sd_8_gen1_5g_firmware, sd439_firmware, sd460_firmware, sd480_firmware, sd660_firmware, sd662_firmware, sd675_firmware, sd678_firmware, sd680_firmware, sd690_5g_firmware, sd695_firmware, sd720g_firmware, sd730_firmware, sd750g_firmware, sd765_firmware, sd765g_firmware, sd768g_firmware, sd778g_firmware, sd780g_firmware, sd855_firmware, sd865_5g_firmware, sd870_firmware, sd888_5g_firmware, sd888_firmware, sda429w_firmware, sdx50m_firmware, sdx55_firmware, sdx55m_firmware, sm4125_firmware, sm4375_firmware, sm6250_firmware, sm7250p_firmware, sm7315_firmware, sm7325p_firmware, sw5100_firmware, sw5100p_firmware, wcd9326_firmware, wcd9335_firmware, wcd9341_firmware, wcd9370_firmware, wcd9375_firmware, wcd9380_firmware, wcd9385_firmware, wcn3610_firmware, wcn3615_firmware, wcn3660b_firmware, wcn3680b_firmware, wcn3910_firmware, wcn3950_firmware, wcn3980_firmware, wcn3988_firmware, wcn3990_firmware, wcn3991_firmware, wcn3998_firmware, wcn6740_firmware, wcn6750_firmware, wcn6850_firmware, wcn6851_firmware, wcn6855_firmware, wcn6856_firmware, wcn7850_firmware, wcn7851_firmware, wsa8810_firmware, wsa8815_firmware, wsa8830_firmware, wsa8835_firmware)
Memory corruption in display due to time-of-check time-of-use of metadata reserved size in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables Zafiyet ile ilgili Genel Bilgi, Etki ve Çözümleri için Devamını Oku Kaynak: National Vulnerability Database